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Atomic Force Microscopy (AFM)

Atomic force microscopy (AFM) is an experimental tool to investigate the topography and mechanical properties of a sample’s surface. Typically, the probe of an AFM is a microscopic, very sharp tip attached to a cantilever. The deflection of the cantilever, caused by the interaction between the tip and the sample surface can be measured via a laser and a photodiode. AFM therefore allows for quantitative topography measurements on the nanometer scale (even sub-nm in z-direction) as well as measurement of, e.g., adhesion force, Young’s modulus or friction. An AFM can be used in different environments, including liquids, and is therefore an excellent tool to investigate biological systems.
In our group, we use the following devices:

Bruker FastScan Bio

Bruker BioScope Catalyst

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Ultra High Vacuum Lab

ESCALAB Mk II Photoelectron spectrometer

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Optical Microscopy